Phenom (electron microscope)
Phenom is a small, table-top sized Scanning Electron Microscope (SEM) originally developed by Philips and FEI and further developed by Phenom-World. The microscope features a combination of optical and electron-optical images; the optical image enables a "Neverlost" function so operators may navigate to any point on the sample. Sample loading takes place in 4 seconds (to obtain the CMOS overview image) and only 30 seconds into the vacuum space via rapid transfer technology (no conventional load lock). The system user interface is controlled with a touch screen No SEM experience is required for users to achieve magnifications of up to 100,000 times with a resolution of down to 15 nm. An optional fully integrated X-ray analysis (EDS) system shows the user in just seconds what the sample is made of.
gallery
-
The leg of a fruit fly imaged with the Phenom. Field of view is 101um.
-
Diatoms imaged with the Phenom. Field of view is 50um.
External links
- FEI Sells Phenom™ Product Line
- US Patent #7906762 - Compact Scanning Electron Microscope
- Publication in: Systems Research Forum (SRF) Vol. 1 (2006) of the Stevens Institute of technology