Landau distribution

Landau distribution
Probability density function
Parameters

c ∈ (0, ∞) — scale parameter

μ ∈ (−∞, ∞) — location parameter
Support xR
PDF \frac{1}{2 \pi i} \int_{c-i\infty}^{c+i\infty}\! e^{s \log s + x s}\, ds
Mean Undefined
Variance Undefined
MGF Undefined
CF \exp\!\Big[\; it\mu - |c\,t|(1+\tfrac{2i}{\pi}\log(|t|))\Big]


In probability theory, the Landau distribution[1] is a probability distribution named after Lev Landau. Because of the distribution's long tail, the moments of the distribution, like mean or variance, are undefined. The distribution is a special case of the stable distribution.

Definition

The probability density function of a standard version of the Landau distribution is defined by the complex integral

p(x) = \frac{1}{2 \pi i} \int_{c-i\infty}^{c+i\infty}\! e^{s \log s + x s}\, ds ,

where c is any positive real number, and log refers to the logarithm base e, the natural logarithm. The result does not change if c changes. For numerical purposes it is more convenient to use the following equivalent form of the integral,

p(x) = \frac{1}{\pi} \int_0^\infty\! e^{-t \log t - x t} \sin(\pi t)\, dt.

The full family of Landau distributions is obtained by extending the standard distribution to a location-scale family. This distribution can be approximated by [2][3]

p(x) = \frac{1}{\sqrt{2\pi}} \exp\left\{-\frac{1}{2}(x + e^{-x})\right\}.

This distribution is a special case of the stable distribution with parameters α = 1, and β = 1.[4]

The characteristic function may be expressed as:

\varphi(t;\mu,c)=\exp\!\Big[\; it\mu - |c\,t|(1+\tfrac{2i}{\pi}\log(|t|))\Big].

where μ and c are real, which yields a Landau distribution shifted by μ and scaled by c.[5]

Related distributions

References

  1. Landau, L. (1944). "On the energy loss of fast particles by ionization". J. Phys. (USSR) 8: 201.
  2. Behrens, S. E.; Melissinos, A.C. Univ. of Rochester Preprint UR-776 (1981).
  3. "Interaction of Charged Particles". Retrieved 14 April 2014.
  4. Gentle, James E. (2003). Random Number Generation and Monte Carlo Methods. Statistics and Computing (2nd ed.). New York, NY: Springer. p. 196. doi:10.1007/b97336. ISBN 978-0-387-00178-4.
  5. Meroli, S. (2011). "Energy loss measurement for charged particles in very thin silicon layers". JINST 6: 6013.
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